Housekeeping RAW data from RADEM (JUICE)
RADEM data is stored in two .cdf file types with corresponding labels (.lbx): sc - science and hk - housekeeping
The hk files have operational information including the RADEM's operation mode. Science data is only acquired when RADEM_MODE
is in Normal mode. However, flight calibrations are also made in this Normal mode - refer to the caveats section for more information.
The sc files contain the measurements made by the detectors integrated in time (default is 60s - check INTEGRATION_TIME
variable in the files). In the data_raw, detector observations are split into eight ELECTRONS bins (EDH), eight PROTONS bins
(PDH), two HEAVY_IONS bins (HIDH), 31 directionality detector bins (DDH), and 12 CUSTOM bins (mix of EDH and PDH - check the EAICD). The sensitivity of each bin
depends on the configuration (see the EAICD for more information).
In this configuration all detectors work in single coincidence. The main objective was to maximize its sensitivity to cosmic rays to test all sensors. This means that all
detectors are measuring electrons, protons and heavy ions at the same time. However, they are more sensitive to protons and to heavy ions than to electrons. Moreover, proton
fluxes are typically much higher than that of heavy ions so the response to protons should dominate even with large contamination from electrons and heavy ions.
The PDH was changed to multiple coincidence.
The CUSTOM channels are now being used.
The thresholds of all detectors with the exception of the second HIDH were changed significantly.
PROTONS variable are well separated in energy (see EAICD) with almost no contamination from either electrons or heavy ions.
ELECTRONS variable measure electrons above a certain energy (see EAICD or metadata). The first bin is contaminated by low energy protons (~7.8 MeV). All bins are contaminated by
high energy protons (>~ 45-70 MeV).
Directionality detector bins measure electrons above 0.3 MeV (0º, and 22.5º zenith sensors), 0.35 MeV (45º zenith sensors), and 0.5 MeV (67.5º sensors). All bins are contaminated by high energy
protons (>~ 40-50 MeV).
HEAVY_IONS bin 2 measures ions with energies between 30.9-90 MeV/nucleon and above 100 MeV/nucleon.
CUSTOM channels measure a variety of particles and energies (check EAICD)
Version:2.4.1
Housekeeping RAW data from RADEM (JUICE)
RADEM data is stored in two .cdf file types with corresponding labels (.lbx): sc - science and hk - housekeeping
The hk files have operational information including the RADEM's operation mode. Science data is only acquired when RADEM_MODE
is in Normal mode. However, flight calibrations are also made in this Normal mode - refer to the caveats section for more information.
The sc files contain the measurements made by the detectors integrated in time (default is 60s - check INTEGRATION_TIME
variable in the files). In the data_raw, detector observations are split into eight ELECTRONS bins (EDH), eight PROTONS bins
(PDH), two HEAVY_IONS bins (HIDH), 31 directionality detector bins (DDH), and 12 CUSTOM bins (mix of EDH and PDH - check the EAICD). The sensitivity of each bin
depends on the configuration (see the EAICD for more information).
In this configuration all detectors work in single coincidence. The main objective was to maximize its sensitivity to cosmic rays to test all sensors. This means that all
detectors are measuring electrons, protons and heavy ions at the same time. However, they are more sensitive to protons and to heavy ions than to electrons. Moreover, proton
fluxes are typically much higher than that of heavy ions so the response to protons should dominate even with large contamination from electrons and heavy ions.
The PDH was changed to multiple coincidence.
The CUSTOM channels are now being used.
The thresholds of all detectors with the exception of the second HIDH were changed significantly.
PROTONS variable are well separated in energy (see EAICD) with almost no contamination from either electrons or heavy ions.
ELECTRONS variable measure electrons above a certain energy (see EAICD or metadata). The first bin is contaminated by low energy protons (~7.8 MeV). All bins are contaminated by
high energy protons (>~ 45-70 MeV).
Directionality detector bins measure electrons above 0.3 MeV (0º, and 22.5º zenith sensors), 0.35 MeV (45º zenith sensors), and 0.5 MeV (67.5º sensors). All bins are contaminated by high energy
protons (>~ 40-50 MeV).
HEAVY_IONS bin 2 measures ions with energies between 30.9-90 MeV/nucleon and above 100 MeV/nucleon.
CUSTOM channels measure a variety of particles and energies (check EAICD)
| Role | Person | StartDate | StopDate | Note | |
|---|---|---|---|---|---|
| 1. | PrincipalInvestigator | spase://CNES/Person/CDPP-AMDA/Wojciech.Hajdas |
All RADEM data is publicly available in the PSA/ESA server.
JUICE RADEM Experiment to Archive Interface Control Document (RADEM EAICD)
Web Service to this product using the HAPI interface.
Access to Data via CDPP/AMDA Web application.
ID of the HK report
RADEM working mode (10 - Calibration, 5 - Safe and 15 - Normal)
System Errors: CEU Software Status and Parametric Errors
LRG30728 - Breakdown:
LRG30753 - Breakdown:
BIST Status procedure, responsible to perform the RADEM self-test, where RADEM Detector Heads and Power Supply Health are evaluated.
uProcessor Watchdog reload margin.
PIDH Detector Status, EDH Detector Status, DDH Detector Status (ON/OFF), PIDH ASIC Status, EDH ASIC Status, DDH ASIC Status (SEL detected and internal Errors).
LRT30707 - Bit 0 (LSB): PIDH Detector ON/OFF
LRT30715 - Bit 0 (LSB): EDH Detector ON/OFF
LRT30723 - Bit 0 (LSB): DDH Detector ON/OFF
LRT30706 - Bit 0 (LSB): PIDH ASIC Scrubbing Error
LRT30714 - Bit 0 (LSB): EDH ASIC Scrubbing Error
LRT30722 - Bit 0 (LSB): DDH ASIC Scrubbing Error
System voltages. Parameters under control are PCU +92.5V and +4.3V, Detector 90V, CEU 3.3V and the ASICs suply voltage of 3.3V and 1.8V.
PIDH, EDH, and DDH ASICs Mbias (reference current).
System Temperatures: PCU, CEU, PIDH, EDH, DDH.
System Memory Error Counters: SRAM Single Error, SRAM Double Error, MRAM Double Error and MRAM Double Error.
CEU Memory Error Addresses.
PIDH, EDH, and DDH ASIC Error Counters.
ASIC Latchup Monitor: PIDH, EDH, DDH.
ASIC Scrubbing: PIDH, EDH, DDH Bit 0 error status.
ASIC configuration in use including coincidence logic (Coincidence Tables) and thresholds (Register Table).